Tom Karygiannis is a senior researcher at the National Institute of Standards and Technology. His responsibilities include developing standards, metrics, tests, and validation tools to promote, measure, and validate security systems, particularly for new and emerging technologies. As a senior researcher with the Emerging Technologies Group, Tom has conducted research in secure electronic commerce, wireless security, network intrusion detection, mobile device security, RFID security, and ad hoc network security. Tom has served on expert panels organized by DHS, DARPA, NSF, the Department of Commerce Office of Technology Policy, the White House Office of Science and Technology Policy (OSTP), the Department of Transportation, the Defense Information System Agency, and the National Security Council’s Critical Infrastructure Protection Office. While at NIST he has published over 20 technical papers, written 3 book chapters, his publications are referenced in over 40 books, has served on over 30 international security conference committees, and a member of the editorial board of Elsevier’s Journal on Computers and Security. Tom holds a Ph.D. in Computer Science from the George Washington University and a Master and Bachelor of Science degree in Electrical Engineering from Bucknell University.